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Patents

Current position: Home  >  Scientific Research  >  Patents

一种评估半导体屏蔽材料发射性能的测试装置及评估方法

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Affilication of Author(s):先进电工材料研究院

Application Number:PCT/CN2020/095966

Service Invention or Not:no

Application Date:2020-06-12

Authorization Date:2020-09-16